Differences

This shows you the differences between two versions of the page.

--- brg321:start [2018/08/09 14:21] – amin
+++ brg321:start [2018/10/03 22:13] (current) – amin
@@ Line 1: / Line 1: @@
-====== BRG321 - Microelectronic Design and Characterization Lab ======
+====== Microelectronic Prototyping and Test (MPT) Labs ======
 ===== Equipment =====
@@ Line 6: / Line 6: @@
 ===== Training =====
-  * TPT Wire Bonder
-    * [[https://www.eecs.yorku.ca/ee/EECS_TRAINING/TPT_HB16_WIRE_BONDER/VID_20170418_141939688.mp4|Part-1]]
-    * [[https://www.eecs.yorku.ca/ee/EECS_TRAINING/TPT_HB16_WIRE_BONDER/VID_20170418_143133959.mp4|Part-2]]
-  * PACE TF 1800 REWORK STATION
-    * [[https://www.eecs.yorku.ca/ee/EECS_TRAINING/PACE_TF1800_REWORK_STATION/VID_20170928_123316542.mp4|Part-1]]
-    * [[https://www.eecs.yorku.ca/ee/EECS_TRAINING/PACE_TF1800_REWORK_STATION/VID_20170928_125047390.mp4|Part-2]]
-    * [[https://www.eecs.yorku.ca/ee/EECS_TRAINING/PACE_TF1800_REWORK_STATION/VID_20170928_132723358.mp4|Part-3]]
-  * ITS150 & TS200-SE PROBE STATION
-    * [[https://www.eecs.yorku.ca/ee/EECS_TRAINING/ITS150_AND_TS200SE_PROBE_STATION/ITS_150_Training_Part_1.wmv|ITS150 Part-1]]
-    * [[https://www.eecs.yorku.ca/ee/EECS_TRAINING/ITS150_AND_TS200SE_PROBE_STATION/ITS_150_Training_Part_2.wmv|ITS150 Part-2]]
-    * [[https://www.eecs.yorku.ca/ee/EECS_TRAINING/ITS150_AND_TS200SE_PROBE_STATION/TS200-SE.wmv|TS200-SE]]
-  * KEITHLEY 4200 SCS PARAMETER ANALYZER
-    * [[https://www.eecs.yorku.ca/ee/EECS_TRAINING/KEITHLEY_4200_SCS_PARAMETER_ANALYZER/Part_1.wmv|Part-1]]
-    * [[https://www.eecs.yorku.ca/ee/EECS_TRAINING/KEITHLEY_4200_SCS_PARAMETER_ANALYZER/Part_2.wmv|Part-2]]
-  * KEYSIGHT N5241B MICROWAVE NETWORK ANALYZER
-    * [[https://www.eecs.yorku.ca/ee/EECS_TRAINING/TPT_HB16_WIRE_BONDER/VID_20170418_142907833.mp4|Part-3]]